An Embedded Rectifier-Based Built-In-Test Circuit for CMOS RF Circuits

摘要

Built-In-Test (BIT) for Radio Frequency IntegratedCircuits (RFIC) is an effective method to reduce the testingcost, especially with the increase of integration level andoperating frequency. In this work, a fully integrated CMOSBIT methodology is proposed. The BIT circuit used is rectifierbasedand gate-source connected MOS transistor withSubstrate Positively-Biased (SPB) scheme is used to furtherimprove the detecting sensitivity. With little currentconsumption, high input impedance and high frequencyscalability this circuit can predict complex high frequencyperformances of RF circuits such as gain, operating frequency,bandwidth and linearity. Besides, the influence of Process,supply Voltage, and Temperature (PVT) variations on theperformance of RF circuits can also be monitored by using thisBIT circuit.